| Autor: |
Kalviainen, Heikki, Parkkinen, Jussi, Kaarna, Arto, Rautkorpi, Rami, Iivarinen, Jukka |
| Zdroj: |
Image Analysis; 2005, p588-597, 10p |
| Abstrakt: |
This paper discusses two statistical shape descriptors, the Edge Co-occurrence Matrix (ECM) and the Contour Co-occurrence Matrix (CCM), and their use in surface defect classification. Experiments are run on two image databases, one containing metal surface defects and the other paper surface defects. The extraction of Haralick features from the matrices is considered. The descriptors are compared to other shape descriptors from e.g. the MPEG-7 standard. The results show that the ECM and the CCM give superior classification accuracies. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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