TRANSIENT CHARACTERISTICS OF SiGe/Si QW STRUCTURES AT THz LASING.

Autor: KAGAN, M. S., ALTUKHOV, I. V., PAPROTSKIY, S. K., SINIS, V. P., YASSIEVICH, I. N., KOLODZEY, J.
Předmět:
Zdroj: International Journal of Nanoscience; Jun2007, Vol. 6 Issue 3/4, p279-282, 4p
Abstrakt: Transient characteristics of SiGe-QW laser structures were studied. The excitation of stimulated THz emission is shown to be the result of carrier injection through contacts. The mechanism of intra-center population inversion caused by carrier injection is suggested. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index