| Autor: |
Almazán-Cuéllar, Saúl, Chacón-Aldama, Alfredo, Trujillo-Schiaffino, Gerardo, Salas-Peinbert, Didia, Corral-Martínez, Francisco |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 4/15/2008, Vol. 992 Issue 1, p1117-1122, 6p, 2 Black and White Photographs, 1 Diagram, 1 Graph |
| Abstrakt: |
The cosmetic defects on lenses are a problem in the optical industry. They are an important source of economic looses due to rework. A method to detect the scratch defect is proposed. We will show that using the wavelet approach yields in a high performance method detecting these defects, making more reliable the inspection stage. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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