| Autor: |
Schmuck, S., Dinklage, A., Fischer, R., Knauer, J. P., Kurzan, B., Murmann, H.-D., Pasch, E. |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 3/19/2008, Vol. 993 Issue 1, p195-198, 4p, 1 Diagram, 3 Graphs |
| Abstrakt: |
On Wendelstein 7-X, electron density and electron temperature profiles are planned to be measured by Thomson scattering. The specific system employs fiber bundles for the scattered light which is detected by means of a five-channel polychromator system. The detection system is assembled and its components are characterized. A calibration technique employing a super-continuum light source is assessed by comparison with a calibration technique using an optical parametric oscillator laser system. The characterization is preparing further diagnostic optimization studies employing a virtual instrument. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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