An Electrical Method for Measuring the Difference in Bandgap across the Neutral Base in SiGe HBT's.
| Autor: | Tang, Yue Teng, Hamel, John S. |
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| Zdroj: | IEEE Transactions on Electron Devices; Apr2000, Vol. 47 Issue 4, p797, 8p, 2 Black and White Photographs, 1 Diagram, 10 Graphs |
| Abstrakt: | Presents information on a study which described an electrical method for measuring the bandgap difference across the neutral base of SiGe heterojunction bipolar transistors. Theory; Experimental and numerical results; Conclusion. |
| Databáze: | Complementary Index |
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