| Autor: |
Vendik, Orest G., Ter-Martirosyan, Leon T. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 2/1/2000, Vol. 87 Issue 3, p1435, 5p, 1 Chart, 4 Graphs |
| Abstrakt: |
Presents a study which derived a qualitative characterization of the built-in field produced by charged grain boundaries and estimated the built-in field influence on the dielectric response of ferroelectric samples. Phenomenological description of dielectric permittivity of bulk and thin film ferroelectric samples; Average source of the built-in field; Quantitative estimation of the parameter and comparison with the experimental data. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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