Structural and Thermal Diffusivity Studies of Polycrystalline (CuSe)1-XSeX Metal Chalcogenide Compound.

Autor: Josephine, L. Y. C., Talib, Z. A., Yunus, W. M. M., Zainal, Z., Moksin, M. M., Lim, K. P., Yusoff, W. D. W.
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Zdroj: AIP Conference Proceedings; 2007, Vol. 909 Issue 1, p243-247, 5p, 1 Chart, 1 Graph
Abstrakt: This paper reports the preparation and the characterization of the (CuSe)1-xSex metal chalcogenide semiconductor compounds with different stoichiometric compositions of Se (x = 0, 0.2, 0.4, 0.5, 0.6, 0.8, 1.0) in bulk form. The (CuSe)1-xSex compounds were prepared using the solid state reaction by varying the ratio of CuSe:Se in the reaction mixture. X-ray powder diffraction analysis is used to identify and measure the mass absorption coefficient of the (CuSe)1-xSex compounds to support the thermal diffusivity behaviour. The thermal diffusivity of the polycrystalline (CuSe)1-xSex compounds were measured and analyzed for the first time, using the photoflash technique. The thermal diffusivity values were determined to be in the range of 2.524 × 10-3 cm2/s to 1.125 × 10-2 cm2/s. It was found that the thermal diffusivity value tends to decrease as the parameter x increases. The relationship between the thermal diffusivity, mass absorption coefficient and density of the (CuSe)1-xSex are discussed in detail. © 2007 American Institute of Physics [ABSTRACT FROM AUTHOR]
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