Determination of diffusion in polycrystalline platinum thin films.

Autor:	DiBattista, Michael, Schwank, Johannes W.
Předmět:	KIRKENDALL effect POLYCRYSTALLINE semiconductors THIN films PLATINUM
Zdroj:	Journal of Applied Physics; 11/1/1999, Vol. 86 Issue 9, p4902, 6p, 1 Diagram, 3 Charts, 6 Graphs
Abstrakt:	Presents information on a study which determined the grain boundary diffusion of polycrystalline platinum thin films. Experimental details; Results and discussion; Conclusions.
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu