| Autor: |
Snigireva, Irina, Snigirev, Anatoly, Vaughan, Gavin, Di Michiel, Marco, Kohn, Viktor, Yunkin, Vyacheslav, Grigoriev, Maxim |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2007, Vol. 879 Issue 1, p998-1001, 4p, 2 Diagrams, 2 Charts, 2 Graphs |
| Abstrakt: |
A stacking technique was developed in order to increase focusing efficiency of Fresnel zone plates (FZP) at high energies. Two identical Si chips each of which containing 9 FZPs were used for stacking. Alignment of the chips was achieved by on-line observation of the moiré pattern. The formation of moiré patterns was studied theoretically and experimentally at different experimental conditions. To provide the desired stability Si-chips were bonded together with slow solidification speed epoxy glue. A technique of angular alignment in order to compensate a linear displacement in the process of gluing was proposed. Two sets of stacked FZPs were experimentally tested to focus 15 and 50 keV x rays. The gain in the efficiency by factor 2.5 was demonstrated at 15 keV. The focal spot of 1.8 μm vertically and 14 μm horizontally with 35% efficiency was measured at 50 keV. Forecast for the stacking of nanofocusing FZPs was discussed. © 2007 American Institute of Physics [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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