Conduction and low-frequency noise in high temperature processed polycrystalline silicon thin...

Autor:	Dimitriadis, C.A., Brini, J., Kamarinos, G., Gueorguiev, V. K., Ivanov, Tz. E.
Předmět:	POLYCRYSTALLINE semiconductors SILICON THIN film transistors
Zdroj:	Journal of Applied Physics; 2/1/1998, Vol. 83 Issue 3, p1469, 7p, 3 Charts, 14 Graphs
Abstrakt:	Presents a study which examined the performance of high temperature processed polycrystalline silicon thin film transistors. Details on the experiments conducted; Results of the study; Discussion on the results.
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu