| Autor: |
S.J. Spinks, C.D. Chalk, I.M. Bell, M. Zwolinski |
| Zdroj: |
Journal of Electronic Testing; Feb2004, Vol. 20 Issue 1, p11-23, 13p |
| Abstrakt: |
The paper presents a test stimulus generation and fault simulation methodology for the detection of catastrophic faults in analog circuits. The test methodology chosen for evaluation is RMS AC supply current monitoring. Tests are generated and evaluated taking account of the potential fault masking effects of process spread on the faulty circuit responses. A new test effectiveness metric of probability of detection is defined and the application of the technique to an analog multiplier circuit is presented. The fault coverage figures are therefore more meaningful than those obtained with a fixed threshold. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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