| Autor: |
Brownlie, C., McVitie, S., Chapman, J. N., Wilkinson, C. D. W. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 8/1/2006, Vol. 100 Issue 3, p033902, 9p, 1 Black and White Photograph, 13 Diagrams, 1 Chart |
| Abstrakt: |
Domain wall traps of varying geometry have been studied using Lorentz microscopy in a transmission electron microscope. Electron beam lithography and lift-off were used to fabricate the elements whose shape allowed the formation of a head-to-head domain structure in the central section. Previous micromagnetic simulations have shown that different head-to-head configurations are possible depending on the width and thickness of the strip. In the majority of our in situ magnetizing experiments a vortex domain wall configuration was nucleated. This could be moved reproducibly between the ends of the element under fields of a few tens of oersted. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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