Test sequencing algorithms with unreliable tests.

Autor: Raghavan, Vijaya, Shakeri, Mojdeh
Předmět:
Zdroj: IEEE Transactions on Systems, Man & Cybernetics: Part A; Jul99, Vol. 29 Issue 4, p347, 11p, 9 Charts
Abstrakt: Considers imperfect test sequencing problems under a single fault assumption or a partially observed Markov decision problem. Optimal test sequencing with imperfect tests references; Systems of parallel structure; Near-optimal test sequencing using information heuristics and certainty equivalence; Dynamic programming solution implementation; Top-down graph search algorithms.
Databáze: Complementary Index