| Autor: |
Matichyn, S., Lisker, M., Silinskas, M., Garke, B., Burte, E. |
| Předmět: |
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| Zdroj: |
Integrated Ferroelectrics; 2006, Vol. 81 Issue 1, p289-295, 7p, 3 Diagrams, 5 Graphs |
| Abstrakt: |
A growth of leaf shape crystals was observed by SEM in the case of excess of Pb in the MOCVD grown films. Contrary, when the lead content was 20 at% or lower, the PZT-films were transparent and smooth. X-ray diffraction (XRD) measurements showed a presence of lead oxide phase additionally to the perovskite phase in the as-deposited PZT films. A pyrochlore phase began to form at an annealing temperature at 600°C. PZT films annealed at 520°C exhibit square hysteresis loop with peak Pr values of 60 μ C/cm 2 and coercive voltage of 2 V. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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