| Autor: |
Lau, W. S., Wong, K. F., Taejoon Han, Sandler, Nathan P. |
| Předmět: |
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| Zdroj: |
Applied Physics Letters; 4/24/2006, Vol. 88 Issue 17, p172906, 3p, 1 Diagram, 4 Graphs |
| Abstrakt: |
Previously, we have reported our application of the zero-bias thermally stimulated current (ZBTSC) spectroscopy technique to study defect states in high-dielectric-constant insulator films such as tantalum oxide with much less parasitic current which can be a serious limitation for the conventional thermally stimulated current method. However, a parasitic current can still be observed for ZBTSC because of a small parasitic temperature gradient across the sample. The thermal design of the ZBTSC system can be improved, resulting in zero-temperature-gradient ZBTSC which can be used to detect deeper traps than those by ZBTSC. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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