| Autor: |
Tsai, J. L., Chin, T. S., Yao, Y. D., Kronmüller, H. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 3/1/2006, Vol. 99 Issue 5, p053901, 5p, 1 Black and White Photograph, 1 Chart, 5 Graphs |
| Abstrakt: |
This article correlated Nd2Fe14B single-layer and [(Nd2Fe14B)x/Nb]n multilayer film magnetization reversal processes to the observed microstructure image. Coercivity temperature dependence was fitted to modified nucleation and pinning models. The microstructure parameter (αK) describes the deteriorating effect of Nd2Fe14B grain anisotropy on coercivity in the nucleation model. For a single layer with 400 nm thickness, the αK values change from 0.18 to 0.43 when annealing temperature increases from 550 to 903 K. The highest values of single- and multilayer films are 0.46 and 0.70, respectively. Film magnetization reversals were predominant and fitted the reverse domain nucleation model well. The Nb spacer layer enriched the grain boundaries of the Nd2Fe14B phase, which in turn inhibited the grain growth. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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