Characterization of microtexture in Bi-2223 tapes using electron back-scatter patternorientation imaging.
| Autor: | W WL Liu, D DL Lin, A AG Godfrey, Q QL Liu |
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| Zdroj: | Superconductor Science & Technology; 4/1/2005, Vol. 18 Issue 4, p566-571, 6p |
| Databáze: | Complementary Index |
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