| Autor: |
Vannier, Christophe, Boon-Siang Yeo, Melanson, Jeremy, Zenobi, Renato |
| Předmět: |
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| Zdroj: |
Review of Scientific Instruments; Feb2006, Vol. 77 Issue 2, p023104, 5p, 1 Diagram, 5 Graphs |
| Abstrakt: |
The development of a versatile and easy-to-use instrument designed for Raman micro- and nanospectroscopy in the visible range is described in this work. An atomic force microscope, an inverted confocal microscope, and a piezostage are combined to perform an accurate and fast tip-laser alignment and to characterize large areas under the same conditions of illumination across the surface. In addition, a metallized tip is used to locally enhance the electromagnetic field and to probe the sample surface leading to in situ chemical analysis at the nanoscale. Both far-field and tip-enhanced Raman spectroscopies (TERS) have been carried out on dye molecules and on nano-objects with short exposure times. The TERS observation of tip-induced sample deformation on single-walled carbon nanotubes is also presented. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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