Structure and Properties of Lanthanide Doped Bi 4 Ti 3 O 12 Films.

Autor: Garg, A., Hu, X., Barber, Z.
Předmět:
Zdroj: Ferroelectrics; 2005, Vol. 328 Issue 1, p93-97, 5p, 4 Graphs
Abstrakt: There has been extensive research activity since the discovery of fatigue free La-doped Bi 4 Ti 3 O 12 films on Pt electrodes. These films show superior ferroelectric properties and require a lower deposition temperature than the previously discovered SrBi 2 Ta 2 O 9 . Substitution of Bi by lanthanide elements other than La is of interest due to change in the magnitude of the structural distortion in the perovskite block, thereby, changing the remanent polarization. In this paper we discuss the doping of bismuth titanates with other lanthanide elements (Nd, Sm). The films were prepared by spin coating on Pt coated Si substrates. Structural characterization was performed by X-ray diffraction followed by ferroelectric characterization. [ABSTRACT FROM AUTHOR]
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