| Autor: |
Dewald, James L., Talla, Jamal, Pietrass, Tanja, Curran, Seamus A. |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2005, Vol. 786 Issue 1, p215-219, 5p |
| Abstrakt: |
Raman spectroscopic analysis of plasma treated MWNTs was used characterize defects in MWNTs. Raman spectroscopy was also used to characterize defects induced via acid treatment. The Raman-active disorder modes are used to fingerprint PSF attachment to MWNTs via defect states. © 2005 American Institute of Physics [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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