Autor: |
Mezouar, M., Crichton, W. A., Bauchau, S., Thurel, F., Witsch, H., Torrecillas, F., Blattmann, G., Marion, P., Dabin, Y., Chavanne, J., Hignette, O., Morawe, C., Borel, C. |
Předmět: |
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Zdroj: |
Journal of Synchrotron Radiation; Sep2005, Vol. 12 Issue 5, p659-664, 6p, 2 Color Photographs, 6 Diagrams, 1 Chart |
Abstrakt: |
A new state-of-the art synchrotron beamline fully optimized for monochromatic X-ray diffraction at high pressure and high (or low) temperature is presented. In comparison with the old high-pressure beamline ID30, this new beamline exhibits outstanding performance in terms of photon flux and focusing capabilities. The main components of this new instrument will be described in detail and compared with the performance of beamline ID30. In particular, the choices in terms of X-ray source, X-ray optics, sample environment and detectors are discussed. The first results of the beamline commissioning are presented. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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