Gridless ionized metal flux fraction measurement tool for use in ionized physical vapor deposition studies

Autor: Shodgrass, T. G., Snodgrass, T.G., Booske, J. H., Booske, J.H., Wang, W., Wendt, A. E., Wendt, A.E., Shohet, J. L., Shohel, J.L.
Předmět:
Zdroj: Review of Scientific Instruments; Feb1999, Vol. 70 Issue 2, p1525, 5p, 3 Diagrams, 3 Graphs
Abstrakt: Describes the design and development of a quartz crystal microbalance analyzer which can be used to measure the ionized metal flux fraction arriving at the substrate location. Instrument design and principle of operation; Elimination of the grid components; Orientation of the magnetic field; Precision of the deposition rate.
Databáze: Complementary Index