Arrhenius-Neel thermal decay in polycrystalline thin film media.

Autor: Bertram, H. N., Richter, H. J.
Předmět:
Zdroj: Journal of Applied Physics; 4/15/1999 Part 2A of 2, Vol. 85 Issue 8, p4991, 3p, 1 Chart, 4 Graphs
Abstrakt: Presents information on a study which described an Arrhenius-Neel model for thermal reversal of polycrystalline thin film media with two-dimensional random anisotropy axis orientation. Description of the model; Experimental details; Discussion; Conclusions.
Databáze: Complementary Index