Analysis of Fermi level pinning characteristics in erbium silicided metal–semiconductor interface.
| Autor: | Kim, Seok-kyu, Jeong, Soyeon, Kim, Jaemin, Jang, Moongyu |
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| Zdroj: | Journal of the Korean Physical Society; Nov2024, Vol. 85 Issue 10, p793-797, 5p |
| Databáze: | Complementary Index |
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