Autor: |
Arslan, Halil, Kuzmin, Alexei, Aulika, Ilze, Moldarev, Dmitrii, Wolff, Max, Primetzhofer, Daniel, Pudza, Inga, Kundzins, Karlis, Sarakovskis, Anatolijs, Purans, Juris, Karazhanov, Smagul Zh |
Předmět: |
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Zdroj: |
Zeitschrift für Physikalische Chemie; Nov2024, Vol. 238 Issue 11, p2075-2100, 26p |
Abstrakt: |
We investigate the effective oxidation state and local environment of yttrium in photochromic YHO thin film structures produced by e-beam evaporation, along with their chemical structure and optical properties. Transmission electron microscopy images reveal the oxidized yttrium hydride thin film sample exhibiting a three-layered structure. X-ray photoelectron spectroscopy (XPS) measurements manifest that the oxidation state of yttrium is modified, dependent on the film's composition/depth. Furthermore, Ion beam analysis confirms that this variability is associated with a composition gradient within the film. X-ray absorption spectroscopy at the Y K-edge reveals that the effective oxidation state of yttrium is approximately +2.5 in the transparent/bleached state of YHO. Spectroscopic ellipsometry investigations showed a complex non-linear optical depth profile of the related sample confirming the dominant phase of YHO and the presence of Y2O3 and Y towards the middle of the film. The first evidence of (n; k) dispersion curves for e-beam sputtered photochromic YHO thin films are reported for transparent and dark states. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
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