Backscattering silicon spectrometer (BASIS): sixteen years in advanced materials characterization.
| Autor: | Osti, Naresh C., Jalarvo, Niina, Mamontov, Eugene |
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| Zdroj: | Materials Horizons; 10/7/2024, Vol. 11 Issue 19, p4535-4572, 38p |
| Databáze: | Complementary Index |
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