| Autor: |
Dakhn, Laila Naji Ba, Bakar, Mohd Aftar Abu, Tajuddin, Razik Ridzuan Mohd, Ibrahim, Kamarulzaman |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2024, Vol. 3150 Issue 1, p1-7, 7p |
| Abstrakt: |
Degradation models, which are a function of time, are frequently used in reliability analysis. This study uses a linear path degradation model in order to derive the failure time distribution and its percentiles based on parametric and semi-parametric methods. For the parametric technique, which is represented by the maximum likelihood estimator, the random effect parameter is followed the skew normal distribution to estimate the time to failure distribution. While for semi-parametric technique the skew normal distribution beside the classical kernel density function is considered to derive the time-to-failure distribution. The performance of these methods is compared by the criteria bias and mean squared error via a simulation study and unspecified data. In addition, GaAs laser degradation data is provided as an application of real data. Parametric method has a good performance than semi-parametric method under simulated and real data while under unspecified data the semi-parametric method is given a good performance. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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