Double‐edge scan wavefront metrology and its application in crystal diffraction wavefront measurements.

Autor: Liu, Fang, Li, Ming, Diao, Qianshun, Li, Zhe, Shen, Zhibang, Li, Fan, Hong, Zhen, Lian, Hongkai, Yue, Shuaipeng, Hou, Qingyan, Zhang, Changrui, Zhang, Dongni, Li, Congcong, Yang, Fugui, Yang, Junliang
Předmět:
Zdroj: Journal of Synchrotron Radiation; Sep2024, Vol. 31 Issue 5, p1146-1153, 8p
Abstrakt: Achieving diffraction‐limited performance in fourth‐generation synchrotron radiation sources demands monochromator crystals that can preserve the wavefront across an unprecedented extensive range. There is an urgent need for techniques of absolute crystal diffraction wavefront measurement. At the Beijing Synchrotron Radiation Facility (BSRF), a novel edge scan wavefront metrology technique has been developed. This technique employs a double‐edge tracking method, making diffraction‐limited level absolute crystal diffraction wavefront measurement a reality. The results demonstrate an equivalent diffraction surface slope error below 70 nrad (corresponding to a wavefront phase error of 4.57% λ) r.m.s. within a nearly 6 mm range for a flat crystal in the crystal surface coordinate. The double‐edge structure contributes to exceptional measurement precision for slope error reproducibility, achieving levels below 15 nrad (phase error reproducibility < λ/100) even at a first‐generation synchrotron radiation source. Currently, the measurement termed double‐edge scan (DES) has already been regarded as a critical feedback mechanism in the fabrication of next‐generation crystals. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index
Externí odkaz:
Nepřihlášeným uživatelům se plný text nezobrazuje