Detection of Defects on Cut-Out Switches in High-Resolution Images Based on YOLOv5 Algorithm.
| Autor: | Kim, Young Jun, Lim, Sung Soo, Jeong, Se-Yeong, Yoon, Ji Won |
|---|---|
| Zdroj: | Journal of Electrical Engineering & Technology (19750102); Sep2024, Vol. 19 Issue 7, p4537-4550, 14p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
Full text from SpringerLink