| Autor: |
Wu, Yankang, Yang, Pin, Zhang, Xing, Dong, Jianjun, Xu, Jie, Li, Mingtao, Chen, Zhongjing, Li, Yingjie, Jiang, Wei, Sun, Chuankui, Chen, Liang, Li, Wenjie, Yan, Ji, Pu, Yudong, Dong, Yunsong, Yang, Dong, Wang, Feng, Mu, Baozhong, Zhao, Zongqing |
| Předmět: |
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| Zdroj: |
AIP Advances; Aug2024, Vol. 14 Issue 8, p1-8, 8p |
| Abstrakt: |
The Kirkpatrick–Baez (KB) microscope is an effective instrument for x-ray imaging of hot spot. However, the non-uniform distribution of response efficiency in the field of view is a drawback of the KB microscope. A more accurate hot spot image requires the correction of the measured image by combining the hot spot position and the response efficiency distribution. Here, we describe a method to locate the position of the hot spot in the field of view during hot spot imaging with a KB microscope. The position of the hot spot in the field of view can be obtained by measuring the grazing incidence angle change during hot spot imaging. In the experiment of hot spot self-emission imaging with a four-channel KB microscope, the location of the hot spot with an accuracy of 15 μm was realized, and the intensity corrected hot spot image was obtained. This will solve the problem of the non-uniform distribution of the response efficiency of the KB microscope and enable quantitative measurement of hot spot radiation intensity. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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