| Autor: |
Taichi Murakami, Masaki Shimofuri, Toshiyuki Tsuchiya, Shugo Miyake |
| Předmět: |
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| Zdroj: |
Sensors & Materials; 2024, Vol. 36 Issue 8, Part 3, p3445-3452, 8p |
| Abstrakt: |
A temperature measurement system with a reflected laser beam that does not require temperature modulation was developed for the thermal design of electronic devices. The system combines a balanced photodetector and lock-in amplifier to make reflectance change measurements possible with an extremely high signal-to-noise ratio. First, to evaluate the accuracy of the reflectance change measurement, the reflectance change of a Ni thin film temperature-controlled by a heater and thermocouples was measured as a function of temperature change. To evaluate the accuracy of the temperature change measurement, the reflectance change was measured by heating a Ni thin film that imitated the wiring pattern of an electronic circuit. The experimental results showed that the standard deviation of the ratio of reflectance change from the reference reflectance was <1.00 × 10−5 at a constant temperature. Moreover, the error margin of the calculated temperature change was ±1.0% for a change of 22 °C or more from the reference temperature, and the performance was sufficient for the estimation of local temperature. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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