Thermal breakdown characteristics and damage mechanisms of novel GaN HEMT aviation nanodevices in high-intensity radiation fields.
Autor: | Ma, Zhenyang, Liu, Dexu, Xu, Ke, Duan, Zhaobin |
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Zdroj: | Journal of Physics: Conference Series; 2024, Vol. 2820 Issue 1, p1-7, 7p |
Databáze: | Complementary Index |
Externí odkaz: |