Characterization of Si particles in additively manufactured AlSi10Mg using synchrotron transmission X-ray nanotomography.

Autor: Defer, M, Dasgupta, S, Shahani, A J, Xiao, X, Juul Jensen, D, Zhang, Y
Zdroj: IOP Conference Series: Materials Science & Engineering; 2024, Vol. 1310 Issue 1, p1-6, 6p
Databáze: Complementary Index