Challenges in characterizing additively manufactured AlSi10Mg using X-ray Laue micro-beam diffraction.
| Autor: | Zhang, Y, Defer, M, Liu, W, Knipschildt-Okkels, E F F, Oddershede, J, Slyamov, A, Bachmann, F, Lauridsen, E, Juul Jensen, D |
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| Zdroj: | IOP Conference Series: Materials Science & Engineering; 2024, Vol. 1310 Issue 1, p1-6, 6p |
| Databáze: | Complementary Index |
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