Combining Scanning Nanobeam Electron Diffraction with 3D Electron Diffraction to Investigate Crystal Defects.
| Autor: | Leung, H W, Copley, R C B, Laulainen, J E M, Johnstone, D N, Midgley, P A |
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| Zdroj: | Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-5, 5p |
| Databáze: | Complementary Index |
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