Adapting Entry-Level TEMs for Single Particle CryoEM Data Collection.
| Autor: | Strugatsky, David, Jih, Jonathan, Arbing, Mark, Spilman, Michael, Mecklenburg, Matthew |
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| Zdroj: | Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p |
| Databáze: | Complementary Index |
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