Defect Imaging of Nickel-Based Superalloy in the SEM Utilizing Tilt-Free EBSD.
| Autor: | Veghte, Daniel P, Egan, Ashton J, Mills, Michael J |
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| Zdroj: | Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p |
| Databáze: | Complementary Index |
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