Segmenting Atomic Layers in Images of Atomically Resolved van der Waals Bilayers.

Autor: Houston, Austin C, Harris, Sumner B, Hachtel, Jordan A, Yu, Yiling, Geohegan, David B, Xiao, Kai, Duscher, Gerd
Zdroj: Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p
Databáze: Complementary Index