Quantitative Electron Microscopy of Zeolites Using Aberration Corrected (S)TEM and Machine Learning.

Autor:	Choudhury, Tahmid, Huang, Chen, Varambhia, Aakash, Turrina, Alessandro, Shannon, Mervyn, Ozkaya, Dogan, Kirkland, Angus I
Zdroj:	Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-5, 5p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu