Adapting Conventional SEM and STEM Instruments for Acquisition of Electron-Beam Induced Current (EBIC) Images.
| Autor: | Camino, F E, Han, M G, Pofelski, A, Rua, A, Kisslinger, K, Hayes, D C, Alban, J, Agrawal, R |
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| Zdroj: | Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p |
| Databáze: | Complementary Index |
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