Practical Considerations for FAIR Data for the APT and FIM Communities: Lessons Learned from the NIST Electron Microscopy Facility.
| Autor: | Lau, June W |
|---|---|
| Zdroj: | Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-3, 3p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|