| Autor: |
Tsai, YuTang, Wu, JiaLong, Huang, MinChun, Tien, KunCheng, Fang, YenWen |
| Předmět: |
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| Zdroj: |
SID Symposium Digest of Technical Papers; Jun2024, Vol. 55 Issue 1, p1234-1237, 4p |
| Abstrakt: |
The objective of this paper was to investigate the quality of see‐through images on transparent MicroLED displays. Transparent displays have gained significant attention in various applications. However, evaluating the quality of see‐through images presented challenges, as there was no universal metric available for assessment. Image analysis methods were employed in this study, and common optical measurement metrics were also compared. The results showcased that CW‐SSIM exhibited higher sensitivity and aligned well with visual observations. This suggests the potential of CW‐SSIM as a universal metric for assessing the quality of see‐through images on transparent displays. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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