| Autor: |
Zheng, Kening, Fu, Qiang, Shi, Bo, Chen, Long, Gao, Dongyu, Zhu, Li, Li, Langtao, Wang, Dengyu, Pan, Xuenan, Zhang, Kai, Yang, Dongfang, Tang, Guoqiang, Jin, Fujiang |
| Předmět: |
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| Zdroj: |
SID Symposium Digest of Technical Papers; Jun2024, Vol. 55 Issue 1, p377-381, 5p |
| Abstrakt: |
By analyzing OLED film layers using the TOF SIMS method with 3D imaging capability, we can effectively improve the detection of OLED defects and understand the constitutive relationship. This inspection method can be integrated into the production line to realize process improvement and defect interception during mass production. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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