| Autor: |
Jia, Wenbin, Liu, Xiaoning, Li, Feng, Wan, Xiang, Sun, Li, Zheng, Kening, Ma, Kaihong, Xu, Minghong, You, Juanjuan, Shih, Huai-Ting, Yu, Jianwei |
| Předmět: |
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| Zdroj: |
SID Symposium Digest of Technical Papers; Jun2024, Vol. 55 Issue 1, p268-271, 4p |
| Abstrakt: |
We discuss the effects of different electron injection layers (EILs) (NaF/LiF/Liq/ETL:Li) on the electrical properties, lifetime and capacitance systematically base on the bottom emission blue OLED device in the paper. We can determine the aging speed and initial decay of the OLED device from the characteristics of the capacitance. In the Addition, the mechanism of diverse inorganic electron injection layers resulting in the different characteristics of OLED devices is deeply analyzed. Finally, the cause of lifetime collapse with thicker inorganic EIL (70A) is speculatedfrom the two aspects of ion migration by TOF‐SIMS and electron injection capacity. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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