Characterizing MEMS Switch Reliability for Cryogenic Applications such as Quantum Computing.
| Autor: | Bradley, Peter, Sorenson, Elizabeth, Lauria, Damian, Liew, Li-Anne |
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| Zdroj: | IOP Conference Series: Materials Science & Engineering; 2024, Vol. 1302 Issue 1, p1-8, 8p |
| Databáze: | Complementary Index |
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