| Autor: |
Kruger, S. E., Leddy, J., Howell, E. C., Madireddy, S., Akcay, C., Bechtel Amara, T., McClenaghan, J., Lao, L. L., Orozco, D., Smith, S. P., Sun, X., Samaddar, A., Pankin, A.-Y. |
| Předmět: |
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| Zdroj: |
Physics of Plasmas; May2024, Vol. 31 Issue 5, p1-13, 13p |
| Abstrakt: |
Bayesian statistics offers a powerful technique for plasma physicists to infer knowledge from the heterogeneous data types encountered. To explain this power, a simple example, Gaussian Process Regression, and the application of Bayesian statistics to inverse problems are explained. The likelihood is the key distribution because it contains the data model, or theoretic predictions, of the desired quantities. By using prior knowledge, the distribution of the inferred quantities of interest based on the data given can be inferred. Because it is a distribution of inferred quantities given the data and not a single prediction, uncertainty quantification is a natural consequence of Bayesian statistics. The benefits of machine learning in developing surrogate models for solving inverse problems are discussed, as well as progress in quantitatively understanding the errors that such a model introduces. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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