| Autor: |
Jidin, Aiman Zakwan, Hussin, Razaidi, Lee, Weng Fook, Mispan, Mohd Syafiq |
| Předmět: |
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| Zdroj: |
Journal of Circuits, Systems & Computers; 5/30/2024, Vol. 33 Issue 8, p1-17, 17p |
| Abstrakt: |
March algorithms are widely used in Memory Built-In Self-Test (MBIST) on-chip memory testing, providing linear test complexities that reduce the test time and cost. However, studies show that March algorithms with complexities lower than 18N have poor coverages of faults that have emerged with the advent of the nanometer process technologies and are more relevant to nowadays memories. New March AZ1 and March AZ2 algorithms, with 13N and 14N complexities, respectively, were introduced to provide optimum coverage of those faults and to produce a shorter test than an 18N-complexity test algorithm with a lesser area overhead, thus reducing chip manufacturing costs. This paper presents the implementation and validation of MBIST controllers that applied the March AZ1 and March AZ2 algorithms in a Field-Programmable Gate Array (FPGA) device. They were implemented in the Intel Max 10 DE10-Lite FPGA Development Board. A test generator was built in FPGA, as an alternative to the external tester, to provide test vectors required in initiating the test on the memory model using the implemented MBIST. The FPGA experimental tests demonstrated that they function correctly as the expected test sequences were observed. In addition, their fault detection abilities were also validated through tests on a fault-injected memory model, which shows that the implemented March AZ1 and March AZ2 provide 80.6% and 83.3% coverage of the intended faults, respectively, which outperform any other existing 14N-complexity March algorithms. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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