Calculations of Refractive Index Using Optical Band Gap: TiO2 Spray Pyrolysis Thin Films.

Autor: Zargar, R. A., Khan, Muzaffar Iqbal, Mearaj, Tuiba, Bashir, Faisal, Arfat, Yassar, Singh, Joginder, Kumar, Kuldeep
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Zdroj: Journal of Nano- & Electronic Physics; 2024, Vol. 16 Issue 1, p1-4, 4p
Abstrakt: Spray pyrolysis technique has been applied to deposit a broad range of thin films, which are used in various devices such as solar cells, sensors, and solid oxide fuel cells. Spray pyrolysis is one of the most common, inexpensive, simple, and quite versatile methods used for synthesizing submicron and sphericalshaped luminescent materials multicomponent oxide thin films. In this paper, spray pyrolysis TiO2 thin films has been deposited on glass substrates and kept at different temperature to reveal its optical properties by the help of UV-visible spectroscopy. Refractive index (n) of TiO2 thin films as wide semiconductor has been calculated using optical energy gap (Eg). The calculated values of refractive index from the new relations have been compared with the values reported by different researchers; an excellent agreement has been obtained between them. The material identification was confirmed from X-ray diffraction techniques and first derivative of transmission spectra’s has been plotted that gives band gap value of films respectively. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index