| Abstrakt: |
This research paper shows tracing of potential innovative light securing in thin crystalline silicon to increase enhance high broadband ray light absorption capability in the arrange terms 300-1200 nm wavelength area. For the tracing, single crystalline silicon thin wafer typically with 100 µm thickness is studied. The solar spectrum (air mass (AM) 1.5G illumination) at conventional incidence is applied. A detached front side and rear side inverted pyramid with silicon oxide (SiO2) passivation films on crystalline silicon wafer, and low index reflector back surface reflector (BSR) are the coherent Lambertian light trapping strategy vitality examined in this endeavor. With additional light trapping design, optical properties of the thin silicon are studied. The result shows, increase in reflection, transmission and absorption of the incident light. [ABSTRACT FROM AUTHOR] |
