Autor: |
Ryabchikov, A. I., Korneva, O. S., Ivanova, A. I., Varlachev, V. A., Chernyshev, A. A. |
Zdroj: |
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; 2023 Suppl 1, Vol. 17, pS162-S165, 4p |
Abstrakt: |
The article presents the results of studies of the features and regularities of high-intensity nitrogen ion implantation into titanium using repetitively-pulsed beams with high average power densities. It is shown that the method of low-energy high-intensity nitrogen ion implantation at current densities of 180, 140, 60, and 10 mA/cm2 makes it possible to obtain wide ion-doped layers in titanium. The regularities of changes in both thickness and elemental composition of ion-doped layers depending on the ion current density have been established. It has been established that a wide diffusion layer is observed at ion current densities from 60 to 180 mA/cm2. Nitrogen concentration in the diffusion layer increases with an increase in the ion current density. The article presents the transmission electron microscopy data showing that the modified layers at a depth of 10 μm consist of α-Ti, in the volume of which nanosized particles of δ-TiN with average size of 15.4 nm crystallize. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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